Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
disable zoom
view article
Figure 4
The scattering pattern obtained at 723 K showing the functions used for fitting the Guinier and Porod regions [dotted line: data; solid line: Guinier (A) and Porod (B) functions; dashed line: unified model fit].
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39
|
Part 4
|
August 2006
|
Pages 589-594
https://doi.org/10.1107/S0021889806019637
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS