Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 5
Guinier plot of log
I
(
q
)
versus
q
2
showing the fit of the Guinier part of the unified model (solid line) to the scattering pattern obtained at 648 K and 17.98 keV (dotted line).
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39
|
Part 4
|
August 2006
|
Pages 589-594
https://doi.org/10.1107/S0021889806019637
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