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Figure 2
Scattered X-ray intensity for chlorartinite at T = 295 K as a function of diffraction angle 2θ. Shown are the observed pattern (diamonds), the best Rietveld-fit profile (a), the difference curve between the observed and calculated profile (b), and the reflection markers (vertical bars). The high-angle part starting at 20° (2θ) is enlarged by a factor of 5. The wavelength was λ = 0.64889 (2) Å. The R values are Rp = 5.2%, Rwp = 6.6% and R(F2) = 11.1%.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39| Part 5| September 2006| Pages 739-744
doi:10.1107/S0021889806032109
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