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Figure 7
Comparison in performance between ENGIN-X and its predecessor ENGIN. (a) Ceria (200) diffraction peak as measured by both instruments. (b) Contributions to the instrument resolution: moderator (circles) and geometrical (triangles). In ENGIN-X, both component are matched over the complete wavelength range. (c) Gain in intensity: scattering spectra for a vanadium specimen. The fall of the ENGIN-X spectrum at low wavelength is due to the curvature of the neutron guide.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39| Part 6| December 2006| Pages 812-825
https://doi.org/10.1107/S0021889806042245
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