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Figure 5
(a) The Si cell parameter from independent refinement of data sets and (b) from parametric fitting. In each case the solid line represents equation (3)[link]. (c) A histogram of the offset between refined and ideal Si cell parameters. (d) Superposition of the sample cell parameter obtained by the two methods. In each graph, open symbols represent independent fitting, and closed symbols represent parametric fitting. For ease of comparison, both individual and parametric fitting refinement values used the 2θ correction polynomial derived from parametric fitting.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part 1| January 2007| Pages 87-95
doi:10.1107/S0021889806043275
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