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Figure 9
(a) Fractional site occupancy and (b) unit-cell parameters extracted from independent Rietveld refinements (open symbols) and by parametric fitting (solid line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part 1| January 2007| Pages 87-95
doi:10.1107/S0021889806043275
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