Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 2
The sample pressures generated at various applied pressures. Low-angle diffraction images (top inset) show the diffraction texture which develops for the gasket. A representative Rietveld refinement profile is shown (inset).
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40
|
Part 1
|
January 2007
|
Pages 196-198
doi:10.1107/S0021889806047923
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.