Temperature phase changes in solid bicyclo[3.3.1]nonane-2,6-dione and bicyclo[3.3.1]nonane-3,7-dione from powder X-ray diffraction data

Brunelli, M.; Neumann, M.A.; Fitch, A.N.; Mora, A.J.

doi:10.1107/S0021889807028087

Journal of Applied Crystallography Journal of Applied
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Figure 3
Observed (dots), calculated (line) and difference plot of the final Rietveld refinement of the low-temperature phase of bicyclo[3.3.1]nonane-2,6-dione recorded at 80 K using a wavelength of 0.80081 (4) Å; reflection positions are shown as vertical lines.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 40| Part 4| July 2007| Pages 702-709

doi:10.1107/S0021889807028087

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