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Figure 3
Cross-sectional TEM bright field micrograph of the Ne-implanted sample at 873 K (cavities can be clearly seen as white spot with a dark edge for underfocus conditions in the inset).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| November 2007| Pages s350-s354
doi:10.1107/S0021889806043755
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