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![[Figure 4]](aj6009fig4mag.jpg)
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Figure 4
GISAXS intensities along qy = 0.020 Å−1 (full symbols) and qy = 0.075 Å−1 (open symbols) versus scattering angle for nc-Ni samples deposited at different substrate temperatures. |
![[Figure 4]](aj6009fig4.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 4
GISAXS intensities along qy = 0.020 Å−1 (full symbols) and qy = 0.075 Å−1 (open symbols) versus scattering angle for nc-Ni samples deposited at different substrate temperatures. |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
