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Figure 7
With sub-microbeam GISAXS a region of 50 µm is scanned in steps of [\Delta y] = 1 µm. Full ([y\psi]) mapping: all horizontal cuts are plotted from the 2D sub-microbeam GISAXS data as a function of the out-of-plane angle [\psi] at the scanning position y. The black vertical stripe at [q_y\simeq 1] nm−1 originates from the shadow of the beamstop holder needed to protect the sensitive detector against the intense specular peak in GISAXS.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| December 2007| Pages s341-s345
doi:10.1107/S0021889806048369
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