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Figure 4
Reflectivity curve of a dried film of HFBIII and a fit using a box model for the electron density (insert) (Seeck et al., 2000BB26). In the fit the thickness of the hydrophobin film is 91 Å. The roughnesses of the interfaces are described by a Gaussian function with σair/film = 6.9 Å and σfilm/Si = 12.5 Å. The (electron) density of the hydrophobin film was also treated as a fitting parameter.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| February 2007| Pages s355-s360
doi:10.1107/S0021889807001331
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