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Figure 1
Surface electronic micrograph (SEM) of a LOFO sample irradiated with 3 × 108 Xe ions cm−2, UV treated and etched for 5 min in 5 M NaOH at 333 K (courtesy of S. Poissonnet and P. Bonnaillie, DMN/SRMP, CEA-Saclay).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| February 2007| Pages s388-s392
doi:10.1107/S0021889807000088
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