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Figure 3
Right: Scattering pattern of LOFO foil irradiated with 3 × 108 ions cm−2, UV sensitized and etched for 8 min. The sample was tilted vertically by −4.5° with respect to the X-ray beam. The data pixels in the central square are removed because they correspond to the beam stopper for the primary X-ray beam. Left: The scattering intensity is analyzed as a function of the scattering vector by plotting the pixel intensity along the narrow vertical (stars) and horizontal (circles) rectangular shaped filters. In the model calculation (solid lines), the pores are described by straight cylinders with the radius and the length of the pore as free-fit parameters (including an adjustable size distribution). Each pixel intensity is modelled individually according to equations (4)[link] and (5)[link] (Pépy, 2007BB9). The left picture is a projection on the relevant axis of the data and calculated points, after a two-dimensional fit.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| February 2007| Pages s388-s392
doi:10.1107/S0021889807000088
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