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Figure 3
(a) Mapping of the out-of-plane cuts. The scan direction is y (step size Δy = 150 µm). The scanning range of 2.5 mm is indicated. S denotes the position of the correlation maxima (distance dS) of the gold nanoparticles. DC notes the position of the detector cut in (b) (2θ = 0°, qy = 0, respectively). (b) Mapping of the detector cuts. SBS denotes the specular beamstop, Yon the Yoneda maxima of silicon (αf = 0.2°). In both cases the intensity is shown on a logarithmic scale and is adapted to put emphasis on the visibility of the reported features. The out-of-plane cuts in (a) were done at the position Yon, i.e. the critical angle of silicon.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| April 2007| Pages s346-s349
doi:10.1107/S0021889807007716
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