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Figure 1
Schematic layout of the USAXS Bonse–Hart camera. The scattering intensity is measured by scanning the first analyzer crystal. The second analyzer is usually maintained at the Bragg angle. Two avalanche photodiodes (APDs) monitor the incident and scattering intensities. The incident intensity is recorded by measuring the scattering from a thin mica window which separates the vacuum in the incident section and sample stage.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| December 2007| Pages s459-s462
doi:10.1107/S0021889806045833
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