Focusing and polarized neutron small-angle scattering spectrometer (SANS-J-II). The challenge of observation over length scales from an ångström to a micrometre

Koizumi, S.; Iwase, H.; Suzuki, J.-; Oku, T.; Motokawa, R.; Sasao, H.; Tanaka, H.; Yamaguchi, D.; Shimizu, H.M.; Hashimoto, T.

doi:10.1107/S0021889807014392

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
(a) Focusing USANS mode with high-resolution area detector located at direct beam position. (b) Conventional SANS mode without high-resolution area detector.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 40| Part s1| April 2007| Pages s474-s479

doi:10.1107/S0021889807014392

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