view article
Figure 5
Scattering profiles for folded sheet nano-porous silica material (FSM-16). Preliminary results observed by high-angle sub-detectors of SANS-J-II. The solid line is a scattering profile obtained by time-of flight small/wide-angle neutron scattering spectrometer (SWAN) at KEK, Tsukuba, Japan.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s414-s417
doi:10.1107/S0021889807006280
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS