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Figure 1
(a) Observed (symbols) and calculated XR profiles (solid lines) of the PS/Cr systems. The XR data were fitted using standard multilayer fitting routines for the dispersion profiles (δ) in the X-ray refractive index shown in (b): unexposed (dotted line) and exposed films (solid line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| January 2007| Pages s684-s686
doi:10.1107/S0021889806056457
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