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Figure 5
SAXS data of sample S4. Lines correspond to: total fitted intensity (It, straight line), particle scattering term (IP, short-dashed line) and a term attributed in the first instance to a second set of nanoparticles (IF, dashed line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| April 2007| Pages s696-s700
doi:10.1107/S0021889807009387
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