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Figure 1
Grazing-incidence X-ray scattering patterns of DPPC multibilayers cast on a silicon wafer at about 306 K under different humidities: (A) RH = 36%, (B) RH = 81.38%, (C) RH = 85.58% (D) RH = 88.2% (E) RH = 90.2% and (F) RH = 93.88%. The dashed lines are the cuts for the intensity distribution profiles shown in Fig. 3[link](a). The length of the scale bar is 2.5 cm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s367-s372
doi:10.1107/S0021889807008199
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