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Figure 5
Diffuse scattering cross-sections of a 100 nm PS film on Si at 373 K as a function of grazing angle of incidence. The solid line is the fit to the model discussed in the text. The contributions from the surface (dotted line) and bulk (dashed line) terms are shown separately.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s18-s22
doi:10.1107/S0021889807007996
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