view article
Figure 1
Diffraction data recorded during the course of the HDA-to-LDA transformation. The small-[Q] intensity indicates a transient intensity excess and a state of strongest heterogeneity (SSH) can be identified.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s517-s521
doi:10.1107/S0021889807004992
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS