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Figure 6
Measured ion-induced specific electron depletion (number of removed electrons per nanometre of track length) versus the mean ion LET. The horizontal bars represent dispersion due to variation of the ion LET along the track.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| January 2007| Pages s121-s125
doi:10.1107/S0021889807000064
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