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Figure 7
Field dependence of the integrated interference intensity (H || x, see Fig. 2[link]) at the diffraction peak position for the sample with Ni.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| April 2007| Pages s532-s536
doi:10.1107/S0021889807005559
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