view article
Figure 4
Vertical scan across a representative SAXS pattern from the centre outwards with the interference function clearly visible at around R = 0.018 nm-1, and the fibril transform at around R = 0.045 nm−1. The reciprocal spacing, R, is equivalent to Q/2π, where Q = (4π/λ)sinθ. The wavelength of the X-ray beam, λ, is 0.83 Å and θ is measured as half the scattering angle between the incident and diffracted beam.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s335-s340
doi:10.1107/S0021889807005523
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS