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Figure 2
Scattering patterns under polymer (top) and wax (bottom) contrast from a mixed solution of 0.6% low MW PEB-7.5 copolymer and 4% C24 wax in d-22 at two temperatures within the common aggregation regime; dotted lines have the same meaning as in Fig. 1[link]; the vertical arrows indicate the observed Guinier regimes within the wax scattering pattern at 263 K.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| December 2007| Pages s97-s100
doi:10.1107/S0021889806053507
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