Characterization of two-dimensional ultra-small-angle X-ray scattering apparatus for application to rubber filled with spherical silica under elongation

Shinohara, Y.; Kishimoto, H.; Inoue, K.; Suzuki, Y.; Takeuchi, A.; Uesugi, K.; Yagi, N.; Muraoka, K.; Mizoguchi, T.; Amemiya, Y.

doi:10.1107/S0021889807011697

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Schematic view of the experimental setting. The sample was placed in a uniaxial stretcher. The distance between the sample and the USAXS detector was 160.5 m. The two-dimensional detectors and the stretcher were remotely controlled.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 40| Part s1| April 2007| Pages s397-s401

doi:10.1107/S0021889807011697

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