journal menu
![[Figure 1]](sy6020fig1mag.jpg)
|
|
Figure 1
(a) WAXS profiles of it-PB1 tetragonal and trigonal crystals crystallized at 343.2 K before and just after annealing. Plots ii and iv represent data for samples after annealing. Peaks shown in plots i and ii are indexed with 200, 220, 213 reflections of the tetragonal form; peaks exhibited in plots iii and iv are indexed with 110, 300, 220 reflections of the trigonal form. (Q = 4πλ−1sin θ, where θ is half the scattering angle and λ is the wavelength used.) (b) Electron diffraction pattern of an it-PB1 trigonal crystal grown in a molten cast film at 348.2 K showing hexagonal symmetry. Each of the diffraction spots could be indexed with the trigonal form of it-PB1. |
![[Figure 1]](sy6020fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
