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Figure 1
Schematic geometry of GISWAXS measurements: αi is the incident angle of X-ray beams, αf is the exit angle and 2θf is the angle between the scattered beam and the plane of incidence. The subscripts s and w indicate GISAXS and GIWAXS geometries, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s642-s644
doi:10.1107/S002188980700578X
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