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Figure 3
In-plane intensity profiles of the in-situ GISAXS patterns in Figs. 2[link](a)–(e) measured for the HDPE thin film in a stepwise annealing process from 310 K.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s642-s644
doi:10.1107/S002188980700578X
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