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Figure 4
In-plane intensity profile of ex-situ GISAXS patterns measured for the melt-crystallized HDPE thin films at 300 K and those annealed individually at 378 K, 383 K, 388 K or 393 K for 24 h.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| March 2007| Pages s642-s644
doi:10.1107/S002188980700578X
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