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Figure 2
Two-dimensional GIXD patterns measured at ai = 0.22° for (a) C-PNME film (467 nm thick) as prepared; (b) C-PNME film annealed at 473 K; (c) R-PNBE film (437 nm thick) as prepared; and (d) R-PNBE film annealed at 473 K. αf and 2θf are the exit angles of the scattered X-ray beam with respect to the film surface and to the plane of incidence respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| December 2007| Pages s620-s625
doi:10.1107/S0021889806052289
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