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Figure 7
(a) Variation of the out-of-plane birefringence Δ⊥ (= nxy − nz) with annealing temperature T for 467 nm-thick C-PNME and 437 nm-thick R-PNBE films. nxy and nz are the in-plane and out-of-plane refractive indices of the film at [\lambda] = 633 nm, respectively. (b) Variation of the out-of-plane thermal expansion coefficient (∊⊥) as a function of film thickness for C-PNME and R-PNBE films annealed at 473 K.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| December 2007| Pages s620-s625
doi:10.1107/S0021889806052289
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