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Figure 2
Scattered X-ray intensity as a function of diffraction angle 2θ for K2TaF7 at 993 K. The observed pattern is shown as dots, the calculated pattern by the solid line overlaying them, while the difference plot is the solid line below; reflection positions are shown as vertical lines. Rwp = 0.13.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 41| Part 3| April 2008| Pages 634-636
doi:10.1107/S0021889808005876
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