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Figure 1
(a) Automatic sample changer. (b) In operation at the X33 beamline. (1) Integrated touchscreen monitor, (2) motorized XYZ stage, (3) emergency stop buttons, (4) sample storage drawer, (5) in-vacuum sample measurement environment, (6) video monitor to observe sample measurement cell.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 41| Part 5| August 2008| Pages 913-917
doi:10.1107/S0021889808021018
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