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Figure 1
The diffraction patterns of moissanite (α-6H-SiC) under selected pressure and temperature conditions. The peak intensities of the hkl diffractions at high P–T are normalized relative to that of (102) under ambient conditions for width-comparison purposes. The insert shows an enlargement of the (101), (102) and (103) diffraction lines.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 41| Part 6| November 2008| Pages 1095-1108
doi:10.1107/S0021889808031762
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