Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Cayron, C.; Den Hertog, M.; Latu-Romain, L.; Mouchet, C.; Secouard, C.; Rouviere, J.-L.; Rouviere, E.; Simonato, J.-P.

doi:10.1107/S0021889808042131

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 10
{113} defects in an Si thin film. (a) HRTEM image in cross section in the [011] zone axis and (b) power spectrum. The defects are situated in the (3 $[\overline 1]$ 1) plane as shown by the streaks in the power spectrum.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 42| Part 2| January 2009| Pages 242-252

doi:10.1107/S0021889808042131

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