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Figure 12
Odd EDPs acquired on Si NWs (first column) and on Si thin films (second column), and their simulations with a hypothetical 12H* superstructure (third column) and with a normal cubic Si structure with diffraction effects produced by microtwins and nanotwins (fourth column). The microtwin diffraction spots are represented by blue discs and the nanotwin spots created by streaking are represented by black dots. The spots generated by double diffraction between the microtwins and the parent crystal are represented by grey discs. The simulated zone axes are [011], [211] and [123] (in the 3C cubic basis). The EDPs of lines 3 and 4 are very similar – both are EDPs on the [123] zone axis. The only difference is the presence of doublets in the EDPs of line 4 due to the presence of at least two twin variants. The intensities of the diffraction spots in this figure allow us to conclude unambiguously that the odd EDPs are due to the microtwins and nanotwins, and not to a hexagonal superstructure of silicon.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 42| Part 2| January 2009| Pages 242-252
doi:10.1107/S0021889808042131
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