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Figure 14
Cross-section schemes of overlapping twins in Si NWs and in Si thin films. In the Si NWs, the twins can freely terminate in the matrix or can be stopped by other microtwins or by nanotwins. In Si thin films, we think that the twins are stopped by other microtwins or by {113} planar defects. The overlapping is at the origin of the superstructure-like patterns of Figs. 7[link], 8[link] and 9[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 42| Part 2| January 2009| Pages 242-252
doi:10.1107/S0021889808042131
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