view article
Figure 4
Bicrystalline Si NWs. (a) TEM image of a bent Si NW that changes its growth direction from 〈111〉 to 〈211〉 by twinning. The electron beam is along the [011] zone axis. (b) HRTEM image acquired in the middle of the bicrystal and (c) the corresponding power spectrum of the fast Fourier transform. (d) Another Si NW: after twinning, the position of the Au–Si droplet became unstable because of the angle between the new growth direction 〈112〉 and the {111} planes of the two crystals (denoted a and b), and the droplet topples to the side of the thinner crystal (here b).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 42| Part 2| January 2009| Pages 242-252
doi:10.1107/S0021889808042131
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS