Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Cayron, C.; Den Hertog, M.; Latu-Romain, L.; Mouchet, C.; Secouard, C.; Rouviere, J.-L.; Rouviere, E.; Simonato, J.-P.

doi:10.1107/S0021889808042131

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 6
Nanotwin in an Si NW in the [011] zone axis. (a) HRTEM image and (b) power spectrum of the image. The growth direction is [11 $[\overline 1]$ ] and the twin mirror plane is (1 $[\overline 1]$ 1). The nanotwin has a thickness of nine (111) planes, which produces streaks in the power spectrum; one is marked by an arrow.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 42| Part 2| January 2009| Pages 242-252

doi:10.1107/S0021889808042131

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