Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Cayron, C.; Den Hertog, M.; Latu-Romain, L.; Mouchet, C.; Secouard, C.; Rouviere, J.-L.; Rouviere, E.; Simonato, J.-P.

doi:10.1107/S0021889808042131

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
Odd feature in an Si NW in the [011] zone axis. (a) HRTEM and (b) power spectrum. The superstructure-like pattern follows the [21 $[\overline 1]$ ] growth direction of the NW. A periodicity of 3d₍₁₁₁₎ is clearly visible in both the image and the power spectrum. It is shown in §5.2

that such a pattern is, in fact, a Moiré effect produced by overlapping twins.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 42| Part 2| January 2009| Pages 242-252

doi:10.1107/S0021889808042131

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