Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Cayron, C.; Den Hertog, M.; Latu-Romain, L.; Mouchet, C.; Secouard, C.; Rouviere, J.-L.; Rouviere, E.; Simonato, J.-P.

doi:10.1107/S0021889808042131

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 8
HRSTEM image of a superstructure-like pattern in an Si NW growing along the [21 $[\overline 1]$ ] direction. The superlattice seems to have a periodicity of 3d₍₁₁₁₎, and atomic columns inside the lattice are clearly resolved. In the top right corner is a `simulation' of this superstructure-like pattern that consists of a superposition of the twinned parts of Fig. 4

(b), as explained in §5.2

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 42| Part 2| January 2009| Pages 242-252

doi:10.1107/S0021889808042131

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page