Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Cayron, C.; Den Hertog, M.; Latu-Romain, L.; Mouchet, C.; Secouard, C.; Rouviere, J.-L.; Rouviere, E.; Simonato, J.-P.

doi:10.1107/S0021889808042131

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 9
Cross section of an Si thin film in the [011] zone axis. (a) HRTEM image and (b) power spectrum. The odd feature with a periodicity of 3d₍₁₁₁₎ similar to Fig. 7

is visible in the thicker part of the sample (centre of the image). Its left side, marked by the two inclined arrows, corresponds to a vertical (13 $[\overline 1]$ ) plane. The atomic columns cannot be clearly distinguished. The feature is actually a Moiré effect produced by the superposition of twinned crystals. In the thinner parts of the sample, alternating (but not superposing) twins are indicated by the horizontal arrows.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 42| Part 2| January 2009| Pages 242-252

doi:10.1107/S0021889808042131

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