view article

Figure 1
The definition of the two coordinate systems used for the characterization of in-plane elastic strains using the sin2ψ method: sample system S and laboratory system L (Noyan & Cohen, 1987BB30). The X-ray elastic strain along the direction [{\bf L}_{\rm{3}}] (which is parallel to the diffraction vector [{\bf Q}_{hkl}]) is characterized by measuring the reflection hkl. The orientation of the vector [{\bf Q}_{hkl}] with respect to [{\bf S}_i] is defined by the angles φ and ψ. The direction cosines aij in equation (6)[link] represent a transformation from S to L coordinate systems.

Journal logoJOURNAL OF
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds