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Figure 1
The definition of the two coordinate systems used for the characterization of in-plane elastic strains using the sin2ψ method: sample system S and laboratory system L (Noyan & Cohen, 1987BB30). The X-ray elastic strain along the direction [{\bf L}_{\rm{3}}] (which is parallel to the diffraction vector [{\bf Q}_{hkl}]) is characterized by measuring the reflection hkl. The orientation of the vector [{\bf Q}_{hkl}] with respect to [{\bf S}_i] is defined by the angles φ and ψ. The direction cosines aij in equation (6)[link] represent a transformation from S to L coordinate systems.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 42| Part 3| June 2009| Pages 416-428
https://doi.org/10.1107/S0021889809011807
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