Elastic constants of fibre-textured thin films determined by X-ray diffraction

Martinschitz, K.J.; Daniel, R.; Mitterer, C.; Keckes, J.

doi:10.1107/S0021889809011807

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 8
$[3\Gamma _{hkl}^{\rm{*}}]$ –3Γ_uvw plots indicating for which hkl reflection (and corresponding 3 $[\Gamma _{hkl}^{\rm{*}}]$ value) the X-ray elastic constants $[\{ S_{3333}^{\rm{L}} \} _{\psi = 0}^{hkl}]$ are equal to the mechanical constants $[\langle {S_{3333}^{\rm{L}}} \rangle _{\psi = 0}]$ . 3 $[\Gamma _{hkl}^{\rm{*}}]$ values are plotted as a function of the fibre-texture type expressed through Γ_uvw. (a) The dependence of 3 $[\Gamma _{hkl}^{\rm{*}}]$ on the fraction of randomly oriented crystallites in the range 0–100%, plotted for various uvw textures with ψ_FWHM = 10°. (b) The dependence of 3 $[\Gamma _{hkl}^{\rm{*}}]$ on ψ_FWHM, plotted for various uvw textures supposing a 10% fraction of randomly oriented crystallites.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 42| Part 3| June 2009| Pages 416-428

https://doi.org/10.1107/S0021889809011807

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page