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Figure 6
Rmerge and 〈I/σ(I)〉 plotted against resolution shell. Statistics of CCD and CMOS data are plotted as open circles and open triangles, respectively. Open rectangles represent CCD data collected to examine the effect of sample radiation damage.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 42| Part 6| December 2009| Pages 1165-1175
https://doi.org/10.1107/S0021889809042277
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