view article
Figure 9
(a) An electron diffraction pattern (upper row) showing satellites (combined with faint streaks in this case), modulated about the primary reflections along 〈110〉*, is compared with the calculated diffraction pattern (bottom row), which corresponds to the MC simulation that resulted in Fig. 8[link](c). Both diffraction patterns are analogous in terms of their directions of modulation, but the magnitude of the satellite dispositions from the primaries in the MC pattern is only approximate relative to the electron diffraction pattern. (b) MC simulation of the structure without domains or domain boundaries (left) results in exaggerated diffracted artifacts (right). The intensity of the streaks is closer to the background intensity. Multiple scattering observed in the MC simulations of the IAFE state shown in (a) could result from such artifacts.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 43| Part 1| December 2010| Pages 140-150
doi:10.1107/S0021889809049851
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS