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Figure 3
Portions of co-refined diffractograms of the single-phase sample S1 taken from (a) XRD and (b) HRPD. Numbers in brackets indicate some (hkl) indices in a cubic crystal system. The reflection markers belong to the inverse spinel phase. Plus signs (solid lines) indicate the raw data (the fit to the data). The solid lines below the reflection markers signify the difference between the data and the fit. See Table 2[link](a) for the refined parameters of interest.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 43| Part 3| March 2010| Pages 394-400
doi:10.1107/S0021889810008150
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